Improvement of barrier performance in thin film encapsulation for organic light-emitting diodes by a prior planarization process

被引：0

作者：

Qin, Cunping ^{[1
]}

Yang, Jun ^{[1
]}

Xu, Tao ^{[2
]}

Ding, Xingwei ^{[1
]}

Zhang, Jianhua ^{[1
]}

机构：

[1] Shanghai Univ, Sch Mech Engn & Automat, Shanghai, Peoples R China

[2] Shanghai Univ, Minist Educ, Key Lab Adv Display & Syst Applicat, Shanghai, Peoples R China

来源：

2018 19TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT) | 2018年

关键词：

Organic/inorganic hybrid barriers; Organic light-emitting diodes; Planarization process; Water vapor transmission rate; DEGRADATION; DEVICES; GROWTH;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The organic/inorganic hybrid barriers were fabricated to encapsulate the organic light-emitting diodes. Al2O3 as inorganic layer was deposited by atomic layer deposition (ALD) and polydimethoxysilane (PDMS) as organic layer was prepared by the spin-coating process. It was found that the optimized encapsulation structure with a prior planarization process had a better barrier performance with a lower water vapor transmission rate improved effectively from 4.95 x 10(-1) gm(-2) day(-1) of Al2O3/PDMS films to 7.30 x 10(-3) gm(-2) day(-1) of the hybrid PDMS/Al2O3/PDMS films at 60 degrees C and a relative humidity of 90% and a longer luminance decay time. These improvements were attributed to the surface planarization of encapsulation basement including the coverage of particles by the prior spin-coating process, reducing the defects of inorganic film in process, and the hydrophobic surface of the outermost polymer lowering the adsorption of water vapor.

引用

页码：780 / 784

页数：5

共 24 条

[1] RELIABILITY AND DEGRADATION OF ORGANIC LIGHT-EMITTING DEVICES [J].

BURROWS, PE ;

BULOVIC, V ;

FORREST, SR ;

SAPOCHAK, LS ;

MCCARTY, DM ;

THOMPSON, ME .

APPLIED PHYSICS LETTERS, 1994, 65 (23) :2922-2924

[2] Flexible OLED encapsulated with gas barrier film and adhesive gasket [J].

Cho, A. Ra ;

Kim, Eun Hye ;

Park, Soo Young ;

Park, Lee Soon .

SYNTHETIC METALS, 2014, 193 :77-80

[3] A study of thin film encapsulation on polymer substrate using low temperature hybrid ZnO/Al2O3 layers atomic layer deposition [J].

Choi, Dong-won ;

Kim, Sang-Jun ;

Lee, Ju Ho ;

Chung, Kwun-Bum ;

Park, Jin-Seong .

CURRENT APPLIED PHYSICS, 2012, 12 :S19-S23

[4] Thin film encapsulated flexible organic electroluminescent displays [J].

Chwang, AB ;

Rothman, MA ;

Mao, SY ;

Hewitt, RH ;

Weaver, MS ;

Silvernail, JA ;

Rajan, K ;

Hack, M ;

Brown, JJ ;

Chu, X ;

Moro, L ;

Krajewski, T ;

Rutherford, N .

APPLIED PHYSICS LETTERS, 2003, 83 (03) :413-415

[5] High-performance barrier using a dual-layer inorganic/organic hybrid thin-film encapsulation for organic light-emitting diodes [J].

Duan Yu ;

Wang Xiao ;

Duan Ya-Hui ;

Yang Yong-Qiang ;

Chen Ping ;

Yang Dan ;

Sun Feng-Bo ;

Xue Kai-Wen ;

Hu Nan ;

Hou Jing-Wen .

ORGANIC ELECTRONICS, 2014, 15 (09) :1936-1941

[6] Physical mechanism responsible for the stretched exponential decay behavior of aging organic light-emitting diodes -: art. no. 213502 [J].

Féry, C ;

Racine, B ;

Vaufrey, D ;

Doyeux, H ;

Cinà, S .

APPLIED PHYSICS LETTERS, 2005, 87 (21) :1-3

[7] Multilayer barrier films comprising nitrogen spacers between free-standing barrier layers [J].

Granstrom, Jimmy ;

Villet, Michael ;

Chatterjee, Tirtha ;

Gerbec, Jeffrey A. ;

Jerkunica, Evan ;

Roy, Anshuman .

APPLIED PHYSICS LETTERS, 2009, 95 (09)

[8] Nuclei of dark spots in organic EL devices: detection by DFM and observation of the microstructure by TEM [J].

Kawaharada, M ;

Ooishi, M ;

Saito, T ;

Hasegawa, E .

SYNTHETIC METALS, 1997, 91 (1-3) :113-116

[9] Degradation and failure of organic light-emitting devices [J].

Ke, L ;

Chua, SJ ;

Zhang, K ;

Yakovlev, N .

APPLIED PHYSICS LETTERS, 2002, 80 (12) :2195-2197

[10]

Kim H., 2016, Rev. Sci. Instrum., V87

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