Effects of Zr-Substitution on Microwave Dielectric Properties of Na0.5Nd0.2Sm0.3Ti1-xZrxO3 Ceramics (x=0.00 ∼ 0.30)

被引：6

作者：

Fang, Zixuan ^{[1
,2
]}

Tang, Bin ^{[1
,2
]}

Si, Feng ^{[1
,2
]}

Gong, Yuting ^{[1
,2
]}

Zhang, Shuren ^{[1
,2
]}

机构：

[1] Univ Elect Sci & Technol China, Natl Engn Ctr Electromagnet Radiat Control Mat, Jianshe Rd, Chengdu 610054, Peoples R China

[2] Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devic, Jianshe Rd, Chengdu 610054, Peoples R China

来源：

JOURNAL OF ELECTRONIC MATERIALS | 2016年 / 45卷 / 10期

关键词：

High permittivity; dielectrics; microwave ceramics; temperature coefficient of the resonant frequency; perovskite; EFFECTIVE IONIC-RADII; QUANTUM PARAELECTRICITY; MICROSTRUCTURE; PEROVSKITES; OXIDES;

D O I：

10.1007/s11664-016-4736-6

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, the compound Na0.5Nd0.2Sm0.3Ti1-xZrxO3 (NNSTZx, x = 0.00, 0.01, 0.02, 0.05, 0.09, 0.14, 0.20, 0.30) ceramics were prepared by the conventional solid-state route. The main phase of all NNSTZx samples were indexed as an orthorhombic perovskite structure. The permittivity (er) and quality factor (Q x f) were improved because of improvement of relative density and homogeneous microstructure with minor Zr substitution (x <= 0.02). When x <= 0.14, the temperature coefficient of the resonant frequency (tau f) could be effectively tuned to a relatively low value of 110.3 ppm/degrees C due to a continuous decrease of tolerance factors. A remarkable decrease of sf from 110.3 ppm/degrees C to -2.38 ppm/degrees C was obtained since a certain amount of Nd2Ti2O7 phase was observed with x >= 0.20. Typically, the NNSTZx (x = 0.20) ceramic sintered in air at 1450 degrees C for 2 h exhibited good microwave dielectric properties of epsilon(r) = 75.4, Q xf= 6813 GHz, and tau(f) = 67.8 ppm/degrees C.

引用

页码：5198 / 5205

页数：8

共 29 条

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