Special issue on "Mechatronic systems for micro- and nanoscale applications"

被引:0
作者
Schitter, Georg [1 ]
Sebastian, Abu [2 ]
机构
[1] Vienna Univ Technol, Automat & Control Inst, A-1040 Vienna, Austria
[2] IBM Res Zurich, CH-8802 Ruschlikon, Switzerland
关键词
D O I
10.1016/j.mechatronics.2012.02.004
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
引用
收藏
页码:239 / 240
页数:2
相关论文
共 13 条
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    Jelitto, Jens
    Tsuruta, Kazuhiro
    [J]. MECHATRONICS, 2012, 22 (03) : 349 - 360
  • [2] Model-based control concepts for vibratory MEMS gyroscopes
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    Mair, Florian
    Kugi, Andreas
    [J]. MECHATRONICS, 2012, 22 (03) : 241 - 250
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    Nijmeijer, Henk
    [J]. MECHATRONICS, 2012, 22 (03) : 310 - 319
  • [4] High-bandwidth nanopositioner with magnetoresistance based position sensing
    Kartik, Venkataraman
    Sebastian, Abu
    Tuma, Tomas
    Pantazi, Angeliki
    Pozidis, Haralampos
    Sahoo, Deepak R.
    [J]. MECHATRONICS, 2012, 22 (03) : 295 - 301
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    Kluk, Daniel J.
    Boulet, Michael T.
    Trumper, David L.
    [J]. MECHATRONICS, 2012, 22 (03) : 257 - 270
  • [6] Capillary force actuators: Modeling, dynamics, and equilibria
    Knospe, Carl R.
    Haj-Hariri, Hossein
    [J]. MECHATRONICS, 2012, 22 (03) : 251 - 256
  • [7] Model-based feedback controller design for dual actuated atomic force microscopy
    Kuiper, S.
    Schitter, G.
    [J]. MECHATRONICS, 2012, 22 (03) : 327 - 337
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    Pantazi, Angeliki
    Jelitto, Jens
    Bui, Nhan
    Eleftheriou, Evangelos
    [J]. MECHATRONICS, 2012, 22 (03) : 361 - 367
  • [9] Dual-stage repetitive control with Prandtl-Ishlinskii hysteresis inversion for piezo-based nanopositioning
    Shan, Yingfeng
    Leang, Kam K.
    [J]. MECHATRONICS, 2012, 22 (03) : 271 - 281
  • [10] Optimal measurement constellation of the fluoroBancroft localization algorithm for position estimation in tracking confocal microscopy
    Shen, Zhaolong
    Andersson, Sean B.
    [J]. MECHATRONICS, 2012, 22 (03) : 320 - 326