Positron beam study of sot-gel prepared ordered mesoporous silica thin films

被引：0
|
作者：
Yu, R. S. [1 ]
Qin, X. B. [1 ]
Zhang, P. [1 ]
Wang, B. Y. [1 ]
Wei, L. [1 ]
机构：
[1] Chinese Acad Sci, Key Lab Nucl Anal Tech, Inst High Energy Phys, Beijing 100049, Peoples R China
来源：
12TH INTERNATIONAL WORKSHOP ON SLOW POSITRON BEAM TECHNIQUES (SLOPOS12) | 2011年 / 262卷
关键词：
ANNIHILATION;
D O I：
10.1088/1742-6596/262/1/012068
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Several so-gel prepared silica thin films with ordered meso-pores were studied with a variable energy positron beam. Doppler broadening measurements show that in CTAB-templated samples, film porosity is the superior factor upon pore size and affects the final S parameter. While for P123 and F127-templated films with similar porosity, as hexagonal pores extend along the direction parallel to film surface, a larger effective pore size could be sensed by positrons, which enhances open volume ratio favourable for Ps formation.
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页数：4
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