A Scalable SCR Compact Model for ESD Circuit Simulation

被引：25

作者：

Di Sarro, James P. ^{[1
]}

Rosenbaum, Elyse ^{[1
]}

机构：

[1] Univ Illinois, Dept Elect & Comp Engn, Coll Engn, Urbana, IL 61801 USA

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 2010年 / 57卷 / 12期

关键词：

Compact modeling; electrostatic discharge (ESD); silicon-controlled rectifier (SCR); PROTECTION DEVICES; DESIGN;

D O I：

10.1109/TED.2010.2081674

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A scalable compact model for SCR-based electrostatic discharge (ESD) protection devices is presented. This model captures the effect that layout spacing has on SCR characteristics, such as holding voltage and trigger current. The model also captures both the delayed turn-on of the SCR, which results in large voltage overshoots during fast rise-time ESD events and the charge removal mechanisms that underlie the turn-off transient. Bias and time dependences of SCR on-resistance are captured with a resistance model that accounts for self-heating.

引用

页码：3275 / 3286

页数：12

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