Noise characteristics and reliability of high power white light emitting diodes based on nitrides

被引：2

作者：

Matukas, J. ^{[1
]}

Palenskis, V. ^{[1
]}

Vysniauskas, J. ^{[1
]}

Saulys, B. ^{[1
]}

Pralgauskaite, S. ^{[1
]}

Pincevicius, A. ^{[1
]}

机构：

[1] Vilnius Univ, Radiophys Dep, LT-10222 Vilnius, Lithuania

来源：

SIXTH INTERNATIONAL CONFERENCE ON ADVANCED OPTICAL MATERIALS AND DEVICES (AOMD-6) | 2008年 / 7142卷

关键词：

correlation factor; electrical noise; light emitting diode; low-frequency noise; optical noise; reliability;

D O I：

10.1117/12.816513

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

High power white light emission diode reliability and aging processes have been investigated. Optical, electrical and noise characteristics have been carried out for initial devices and during their aging. Analysis of noise characteristics help revealing of light emission diode aging processes and reliability problems. It is found that optical and electrical noise spectra changes reflect light emission diode aging. Noise characteristics, especially correlation factor between optical and electrical fluctuations, and current-voltage characteristics at low bias reveal physical processes that take place during investigated device aging and rapid its degradation. It is shown that reason of high power light emission diode degradation is related with defects presence in the device structure. Additional defects appear during LED operation and lead to the leakage current and non-radiative recombination increase.

引用

页数：6

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