High field effects in solid dielectrics

被引：41

作者：

Boggs, S ^{[1
]}

Huang, JB

机构：

[1] Univ Connecticut, Elect Insulat Res Ctr, Storrs, CT 06269 USA

[2] Univ Toronto, Dept Elect Engn, Toronto, ON, Canada

来源：

IEEE ELECTRICAL INSULATION MAGAZINE | 1998年 / 14卷 / 06期

关键词：

solid dielectrics; electrical treeing; high electric fields; conductivity;

D O I：

10.1109/57.730802

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The reliability of high voltage dielectrics is tied closely to high field effects, typically in microscopic volumes around defects such as asperities on a conductor, small cavities, etc.

引用

页码：5 / 12

页数：8

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