Influence of the microstructure on the deuterium retention in tungsten

被引：101

作者：

Manhard, A. ^{[1
]}

Schmid, K. ^{[1
]}

Balden, M. ^{[1
]}

Jacob, W. ^{[1
]}

机构：

[1] Max Planck Inst Plasma Phys, D-85748 Garching, Germany

来源：

JOURNAL OF NUCLEAR MATERIALS | 2011年 / 415卷 / 01期

关键词：

D O I：

10.1016/j.jnucmat.2010.10.045

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The microstructure of tungsten samples is systematically modified by recrystallization to investigate the structure dependence of deuterium (D) retention. After a thorough characterization by scanning and transmission electron microscopy, non-recrystallized samples and samples recrystallized by different degrees are loaded with deuterium in a low-temperature plasma device. The deuterium inventory is measured by nuclear reaction analysis and thermal desorption spectroscopy. The post implantation surface morphology is investigated by scanning electron, optical and atomic force microscopy. The modification by recrystallization allows a wide variation in the crystallite size and has a strong impact on the measured D retention. Both the total amount and the binding state of the retained D are changed. (C) 2010 Elsevier B.V. All rights reserved.

引用

页码：S632 / S635

页数：4

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