On the origin of the spatial inhomogeneity of photoluminescence in thin-film CIGS solar devices

被引:12
作者
El-Hajje, Gilbert [1 ,2 ,3 ]
Ory, Daniel [1 ,2 ,3 ]
Guillemoles, Jean-Francois [2 ,3 ,4 ]
Lombez, Laurent [2 ,3 ,4 ]
机构
[1] EDF R&D, 6 Quai Watier, F-78400 Chatou, France
[2] EDF R&D Chatou, Inst Res & Dev Photovolta Energy IRDEP, CNRS, EDF,Chim ParisTech,UMR 7174, Chatou, France
[3] Inst Photovolta Ile de France, IPVF, 8 Rue Renaissance, F-92160 Antony, France
[4] Univ Tokyo, CNRS RCAST Joint Lab, NextPV, Meguro Ku, Tokyo 1538904, Japan
关键词
GENERALIZED PLANCK LAW; RESOLVED PHOTOLUMINESCENCE; CELLS; CU(IN; GA)SE-2; LUMINESCENCE; EFFICIENCY; VERIFICATION; RADIATION; SILICON; SCALE;
D O I
10.1063/1.4958703
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this letter, we investigate the origin of the spatial inhomogeneity of the photoluminescence (PL) intensity maps obtained on thin-film solar cells. Based on a hyperspectral imager setup, we record an absolute map of the quasi-Fermi level splitting Delta u by applying the generalized Planck's law. Then, using scanning confocal microscopy, we perform spatially and time-resolved photoluminescence measurements. This allowed us to quantify and map the micrometric fluctuations of the trapping defect density within these solar cells. Finally, we demonstrate the existence of a direct correlation between the spatial fluctuations of the quasi-Fermi level splitting and the trapping defect density. The latter was found to be correlated with the frequently reported spatially inhomogeneous PL maps of thin-film solar cells. Based on the observed correlation, we can quantify the local losses in quasi-Fermi level splitting induced by the spatial distribution of the trapping defects. Published by AIP Publishing.
引用
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页数:4
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