FDTD Modeling of arbitrary linear lumped networks and practical active devices
被引:2
作者:
Chen, Zhi-hui
论文数: 0引用数: 0
h-index: 0
机构:
S China Univ Technol, Sch Elect & Informat Engn, Guangzhou, Guangdong, Peoples R ChinaS China Univ Technol, Sch Elect & Informat Engn, Guangzhou, Guangdong, Peoples R China
Chen, Zhi-hui
[1
]
Chu, Qing-Xin
论文数: 0引用数: 0
h-index: 0
机构:
S China Univ Technol, Sch Elect & Informat Engn, Guangzhou, Guangdong, Peoples R ChinaS China Univ Technol, Sch Elect & Informat Engn, Guangzhou, Guangdong, Peoples R China
Chu, Qing-Xin
[1
]
机构:
[1] S China Univ Technol, Sch Elect & Informat Engn, Guangzhou, Guangdong, Peoples R China
来源:
2008 ASIA-PACIFIC SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY AND 19TH INTERNATIONAL ZURICH SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, VOLS 1 AND 2
|
2008年
关键词:
D O I:
10.1109/APEMC.2008.4559989
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Two FDTD modeling approaches for lumped circuits are introduced in this paper. One is for arbitrary linear lumped networks based on piecewise linear recursive convolution (PLRC) technique, and it has the same accuracy as previous techniques, but has an advantage of less storage variables. The other is for active devices characterized by measured S-parameters by means of vector fitting (VF) technique, and it avoids the time-domain non-causality occurred in the previous techniques. To show the validity, two microstrip circuits are investigated.