Real-Time Interactive 4D-STEM Phase-Contrast Imaging From Electron Event Representation Data: Less computation with the right representation

被引：21

作者：

Pelz, Philipp M. ^{[1
]}

Johnson, Ian ^{[2
]}

Ophus, Colin ^{[3
]}

Ercius, Peter ^{[4
]}

Scott, Mary C. ^{[1
,3
]}

机构：

[1] Univ Calif Berkeley, Mat Sci & Engn Dept, Berkeley, CA 94720 USA

[2] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

[3] Lawrence Berkeley Natl Lab, Natl Ctr Electron Microscopy, Mol Foundry, Berkeley, CA USA

[4] Lawrence Berkeley Natl Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

来源：

IEEE SIGNAL PROCESSING MAGAZINE | 2022年 / 39卷 / 01期

关键词：

Scanning electron microscopy; Codes; Transmission electron microscopy; Microscopy; Data integrity; Graphics processing units; Detectors; INFORMATION LIMIT; MICROSCOPY; RESOLUTION;

D O I：

10.1109/MSP.2021.3120981

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The arrival of direct electron detectors (DEDs) with high frame rates in the field of scanning transmission electron microscopy (TEM) has enabled many experimental techniques that require collection of a full diffraction pattern at each scan position, a field which is subsumed under the name four-dimensional scanning transmission electron microscopy (4D-STEM). DED frame rates approaching 100 kHz require data transmission rates and data storage capabilities that exceed those of the commonly available computing infrastructures. Current commercial DEDs allow the user to make compromises in pixel bit depth, detector binning, or windowing to reduce the per-frame file size and allow higher frame rates. This change in detector specifications requires decisions to be made before data acquisition that may reduce or lose information that could have been advantageous during data analysis.

引用

页码：25 / 31

页数：7

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