Comparison between time- and frequency-domain high-frequency device characterizations

被引：0

作者：

Bieler, Mark ^{[1
]}

Arz, Uwe ^{[1
]}

机构：

[1] Phys Tech Bundesanstalt, Bundesallee 100, D-38116 Braunschweig, Germany

来源：

2016 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS (CPEM 2016) | 2016年

关键词：

high-frequency devices; vector network analyzer; electro-optic sampling;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We characterize a high-frequency device consisting of coplanar and coaxial elements using time- and frequency domain methods. As frequency-domain technique we employ conventional vector network analysis, while as time-domain technique a recently developed laser-based vector network analyzer is used. This allows us to compare both methods in the frequency range from 10 GHz to 110 GHz for the first time. We obtain good agreement in almost the entire frequency range.

引用

页数：2

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