Automatic analysis of speckle photography fringes

被引:7
作者
Buendia, M
Cibrian, R
Salvador, R
Roldan, C
Inesta, JM
机构
[1] UNIV VALENCIA,DEPT APPL PHYS,VALENCIA 46010,SPAIN
[2] UNIV JAUME 1,DEPT COMP SCI,CASTELLO DE PLANA,SPAIN
来源
APPLIED OPTICS | 1997年 / 36卷 / 11期
关键词
D O I
10.1364/AO.36.002395
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Speckle interferometry is a technique adequate to metrological problems such as the measurement of object deformation. An automatic system of analysis of such measurements is given; it consists of a motorized x-y plate positioner controlled by computer, a CCD video camera, and software for image analysis. A fringe-recognition algorithm determines the spacing and orientation of the fringes and permits the calculation of the magnitude and direction of the displacement of the analyzed object point in images with variable degrees of illumination. For a 256 x 256 pixel image resolution, the procedure allows one to analyze from three fringes to a number of fringes that corresponds to 3 pixels/fringe. (C) 1997 Optical Society of America.
引用
收藏
页码:2395 / 2400
页数:6
相关论文
共 14 条
[1]   RECORDING OF IN-PLANE SURFACE DISPLACEMENT BY DOUBLE-EXPOSURE SPECKLE PHOTOGRAPHY [J].
ARCHBOLD, E ;
BURCH, JM ;
ENNOS, AE .
OPTICA ACTA, 1970, 17 (12) :883-&
[2]  
Boone J M, 1992, J Digit Imaging, V5, P190
[3]   SENSITIVITY AND OPTIMIZATION IN THE DETERMINATION OF DEFORMATIONS BY HOLOGRAPHIC-INTERFEROMETRY [J].
DALMASES, F ;
SALVADOR, R ;
BUENDIA, M ;
ROMERO, C ;
CIBRIAN, R ;
GANDIA, JL .
OPTICS AND LASER TECHNOLOGY, 1988, 20 (05) :269-273
[4]  
ERF RH, 1978, SPECKLE METROLOGY, P225
[5]  
FRANCON M, 1984, LASER SPECKLE RELATE, P175
[6]   BIOMECHANICAL INVESTIGATION OF THE HYOID BONE USING SPECKLE INTERFEROMETRY [J].
KASPRZAK, H ;
PODBIELSKA, H ;
VONBALLY, G ;
FECHNER, G .
INTERNATIONAL JOURNAL OF LEGAL MEDICINE, 1993, 106 (03) :132-134
[7]   CONTRAST OF SPECKLE CORRELATION FRINGES IN PRESENCE OF A LONGITUDINAL DISPLACEMENT BETWEEN 2 EXPOSURES [J].
MENDEZ, JA ;
ROBLIN, ML .
NOUVELLE REVUE D OPTIQUE, 1976, 7 (02) :105-112
[8]   ELECTRONIC SPECKLE PATTERN INTERFEROMETRY USING DIGITAL IMAGE-PROCESSING TECHNIQUES [J].
NAKADATE, S ;
YATAGAI, T ;
SAITO, H .
APPLIED OPTICS, 1980, 19 (11) :1879-1883
[9]  
NATHAN KS, 1990, NASA TECH BRIEF, V14, P2
[10]   IDENTIFICATION OF FRINGE MINIMA IN ELECTRONIC SPECKLE PATTERN IMAGES [J].
PALER, K ;
CRENNELL, KM ;
KITTLER, J ;
DOBBINS, BN ;
BUTTON, BL ;
WYKES, C .
PATTERN RECOGNITION LETTERS, 1987, 6 (01) :33-44