Bulk and surface loss in superconducting transmon qubits

被引：65

作者：

Dial, Oliver ^{[1
]}

McClure, Douglas T. ^{[1
]}

Poletto, Stefano ^{[1
,2
,3
]}

Keefe, G. A. ^{[1
]}

Rothwell, Mary Beth ^{[1
]}

Gambetta, Jay M. ^{[1
]}

Abraham, David W. ^{[1
]}

Chow, Jerry M. ^{[1
]}

Steffen, Matthias ^{[1
]}

机构：

[1] IBM TJ Watson Res Ctr, Yorktown Hts, NY 10598 USA

[2] Delft Univ Technol, QuTech Res Ctr, POB 5046, NL-2600 GA Delft, Netherlands

[3] Delft Univ Technol, Kavli Inst Nanosci, POB 5046, NL-2600 GA Delft, Netherlands

来源：

SUPERCONDUCTOR SCIENCE & TECHNOLOGY | 2016年 / 29卷 / 04期

关键词：

transmon; sapphire; loss tangent; surface loss;

D O I：

10.1088/0953-2048/29/4/044001

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Decoherence of superconducting transmon qubits is purported to be consistent with surface loss from two-level systems on the substrate surface. Here, we present a study of surface loss in transmon devices, explicitly designed to have varying sensitivities to different surface loss contributors. Our experiments also encompass two particular different sapphire substrates, which reveal the onset of a yet unknown additional loss mechanism outside of surface loss for one of the substrates. Tests across different wafers and devices demonstrate substantial variation, and we emphasize the importance of testing large numbers of devices for disentangling different sources of decoherence.

引用

页数：4

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