Rapid structural mapping of ternary metallic alloy systems using the combinatorial approach and cluster analysis

被引：98

作者：

Long, C. J. ^{[1
]}

Hattrick-Simpers, J.

Murakami, M.

Srivastava, R. C.

Takeuchi, I.

Karen, V. L.

Li, X.

机构：

[1] Univ Maryland, Dept Mat Sci & Engn, College Pk, MD 20742 USA

[2] Univ Maryland, Ctr Supercond Res, College Pk, MD 20742 USA

[3] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2007年 / 78卷 / 07期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1063/1.2755487

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We are developing a procedure for the quick identification of structural phases in thin film composition spread experiments which map large fractions of compositional phase diagrams of ternary metallic alloy systems. An in-house scanning x-ray microdiffractometer is used to obtain x-ray spectra from 273 different compositions on a single composition spread library. A cluster analysis software is then used to sort the spectra into groups in order to rapidly discover the distribution of phases on the ternary diagram. The most representative pattern of each group is then compared to a database of known structures to identify known phases. Using this method, the arduous analysis and classification of hundreds of spectra is reduced to a much shorter analysis of only a few spectra. (c) 2007 American Institute of Physics.

引用

页数：6

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