Influence of reactor neutrons irradiation on electrical, optical and structural properties of SnO2 film prepared by sol-gel method

被引：8

作者：

Izerrouken, M. ^{[1
]}

Kermadi, S. ^{[2
]}

Souami, N. ^{[3
]}

Sari, A. ^{[4
]}

Boumaour, M. ^{[2
]}

机构：

[1] Ctr Rech Nucl Drana, Algiers, Algeria

[2] Unite Dev Technol Silicium, Algiers, Algeria

[3] Ctr Rech Nucl Alger, Algiers, Algeria

[4] Ctr Rech Nucl Berine, Ain Oussara, Djelfa, Algeria

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2009年 / 611卷 / 01期

关键词：

Semiconductors; Radiation damage; Optical properties; Electrical properties; Reactor neutrons;

D O I：

10.1016/j.nima.2009.09.003

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

SnO2 films elaborated by sol-gel method were irradiated with reactor neutron. The irradiations were made at a temperature of about 40 degrees C, with fast neutron fluences (E-n > 1.2 MeV) up to 9.6 x 10(17) n cm(-2). The induced defect has been studied by electrical, optical and structural measurements. The electrical measurements show that the resistivity rapidly increases with increasing fluences up to 3.2 x 10(17) n cm(-2) and remains constant for higher fluence (> 6.4 x 10(17) n cm(-2)). The optical measurements show a small decrease of the optical band gap with increasing fluences. From the X-ray diffraction patterns. it was found that the crystallinity and grain size are reduced. (C) 2009 Elsevier B.V. All rights reserved.

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收藏

页码：14 / 17

页数：4

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