A 24 GHz Low-Noise Amplifier Using RF Junction Varactors for Noise Optimization and CDM ESD Protection in 90 nm CMOS

被引:9
作者
Tsai, Ming-Hsien [1 ]
Hsu, Shawn S. H.
机构
[1] Natl Tsing Hua Univ, Dept Elect Engn, Hsinchu 300, Taiwan
关键词
Charge device model (CDM); electrostatic discharge (ESD); low-noise amplifier (LNA); transmission line pulse (TLP); very fast transmission line pulse (VFTLP);
D O I
10.1109/LMWC.2011.2152387
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This letter presents an ESD-protected 24 GHz low-noise amplifier (LNA) in 90 nm CMOS using RF junction varactors for noise optimization and ESD protection simultaneously. One of the junction varactors, inserted as an extra gate-source capacitance, provides an effective CDM ESD protection, and is also used for power-constrained simultaneous noise and input matching. The measured results demonstrate a 2.7 A (corresponding to a 4 kV HBM) and an 11.4 A ESD protection levels using transmission line pulse and very fast transmission line pulse tests, respectively. Under a power consumption of 9.1 mW, the ESD-protected LNA presents a NF of 2.9 dB and power gain of 15.2 dB at the center frequency of 24 GHz.
引用
收藏
页码:374 / 376
页数:3
相关论文
共 14 条
[1]  
[Anonymous], 2010, P 14 INT C EV ASS SO
[2]   A Low Power 77 GHz Low Noise Amplifier With an Area Efficient RF-ESD Protection in 65 nm CMOS [J].
Berenguer, Roc ;
Liu, Gui ;
Xu, Yang .
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, 2010, 20 (12) :678-680
[3]   A Fully Integrated 7.3 kV HBM ESD-Protected Transformer-Based 4.5-6 GHz CMOS LNA [J].
Borremans, Jonathan ;
Thijs, Steven ;
Wambacq, Piet ;
Rolain, Yves ;
Linten, Dimitri ;
Kuijk, Maarten .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2009, 44 (02) :344-353
[4]  
Cao Y, 2008, 2008 IEEE INT SOL ST, P194
[5]   24 GHz LNA in 90nm RF-CMOS with high-Q above-IC inductors [J].
Dupuis, O ;
Sun, X ;
Carchon, G ;
Soussan, P ;
Ferndahl, M ;
Decoutere, S ;
De Raedt, W .
ESSCIRC 2005: PROCEEDINGS OF THE 31ST EUROPEAN SOLID-STATE CIRCUITS CONFERENCE, 2005, :89-92
[6]   Gate-assisted high-Q-factor junction varactor [J].
Gau, JH ;
Wu, RT ;
Sang, S ;
Kuo, CH ;
Chang, TL ;
Chen, HH ;
Chen, A ;
Ko, J .
IEEE ELECTRON DEVICE LETTERS, 2005, 26 (09) :682-683
[7]   The importance of standardizing CDM ESD test head parameters to obtain data correlation [J].
Henry, LG ;
Kelly, MA ;
Diep, T ;
Barth, J .
ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM PROCEEDINGS, 2000, 2000, :72-84
[8]  
Issakov V., 2008, Proc. IEEE International Conference on Microwaves, Communications, P1
[9]   Design of Varactor-Based Tunable Matching Networks for Dynamic Load Modulation of High Power Amplifiers [J].
Nemati, Hossein Mashad ;
Fager, Christian ;
Gustavsson, Ulf ;
Jos, Rik ;
Zirath, Herbert .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2009, 57 (05) :1110-1118
[10]   CMOS low-noise amplifier design optimization techniques [J].
Nguyen, TK ;
Kim, CH ;
Ihm, GJ ;
Yang, MS ;
Lee, SG .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2004, 52 (05) :1433-1442