A Defect Dependency based Approach to Improve Software Quality in Integrated Software Products

被引:0
作者
Karre, Sai Anirudh [1 ]
Reddy, Y. Raghu [1 ]
机构
[1] Int Inst Informat Technol, Software Engn Res Ctr, Hyderabad, Andhra Pradesh, India
来源
ENASE 2015 - PROCEEDINGS OF THE 10TH INTERNATIONAL CONFERENCE ON EVALUATION OF NOVEL APPROACHES TO SOFTWARE ENGINEERING | 2015年
关键词
Defect Dependency; Defect Dataset; Dependency Metric; Software Quality; Integrated Software Products; Rule-based Classification;
D O I
暂无
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Integrated software products are complex in design. They are prone to defects caused by integrated and non-integrated modules of the entire integrated software suite. In such software products, a small proportion of defects are fixed as soon as they are reported. Rest of the defects are targeted for fixes in future product release cycles. Among such targeted defects, most of them seem to be insignificant and innocuous in the current version but have the potential to become acute in future versions. In this paper, we propose an approach to study defect dependency of the reported defect using a dependency metric. Identifying the dependency of a defect in an integrated product suite can help the product stake-owners to prioritize them and help improve software quality.
引用
收藏
页码:110 / 117
页数:8
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