共 15 条
[1]
Advanced fundamental parameters model for improved profile analysis
[J].
ECRS 5: PROCEEDINGS OF THE FIFTH EUROPEAN CONFERENCE ON RESIDUAL STRESSES,
2000, 347-3
:303-308
[2]
*BRUK AXS GMBH, 2008, TOPAS V4 0 GEN PROF
[6]
Cline JP, 2000, INDUSTRIAL APPLICATIONS OF X-RAY DIFFRACTION, P903
[7]
K alpha(1,2) and K beta(1,3) x-ray emission lines of the 3d transitions metals
[J].
PHYSICAL REVIEW A,
1997, 56 (06)
:4554-4568
[8]
ISO, 1993, Guide to the Expression of Uncertainty in Measurement, V1st
[10]
*NIST, 2000, LANTH HEX POWD LIN P