Study for step instabilities induced by ES barrier

被引：1
|
作者：
Kim, JY [1 ]
Yeon, DH
Cha, PR
Yoon, JK
机构：
[1] Seoul Natl Univ, Sch Mat Sci & Engn, Seoul, South Korea
[2] Kookmin Univ, Sch Adv Mat Engn, Seoul, South Korea
来源：
PRICM 5: THE FIFTH PACIFIC RIM INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS AND PROCESSING, PTS 1-5 | 2005年 / 475-479卷
关键词：
phase field model; step dynamics; ES barrier; step bunching; step meandering;
D O I：
10.4028/www.scientific.net/MSF.475-479.3181
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A phase field model for step dynamics on vicinal surface is presented. Using this model, time dependent, collective motions of steps were investigated. Through numerical simulations, morphological step instabilities induced by ES barrier were analyzed, and it is shown that this model could interpret various phenomena during step flow growth such as step bunching and meandering.
引用
收藏
页码：3181 / 3184
页数：4
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