Deep-submicron noise

被引：0
|
作者：
MacDonald, JF [1 ]
McBride, J
Nagaraj, NS
Zhang, XN
Shepard, KL
机构：
[1] Sun Microelect, Palo Alto, CA USA
[2] Hewlett Packards Engn Syst Lab, Ft Collins, CO USA
[3] Texas Instruments Inc, Dallas, TX USA
[4] Columbia Univ, New York, NY USA
[5] Metaflow Technol, La Jolla, CA USA
来源：
IEEE DESIGN & TEST OF COMPUTERS | 1998年 / 15卷 / 04期
关键词：
D O I：
10.1109/MDT.1998.735931
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
[No abstract available]
引用
收藏
页码：82 / 88
页数：7
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