VNA-Based Material Characterization in THz Domain without Classic Calibration and Time-Gating

被引：0

作者：

Kazemipour, Alireza ^{[1
]}

Hoffmann, Johannes ^{[1
]}

Wollensack, Michael ^{[1
]}

Allal, Djamel ^{[2
]}

Hudlicka, Martin ^{[3
]}

Ruefenacht, Juerg ^{[1
]}

Stalder, Daniel ^{[1
]}

Zeier, Markus ^{[1
]}

机构：

[1] Swiss Fed Inst Metrol METAS, Bern, Switzerland

[2] Lab Natl Metrol & Essais LNE, Paris, France

[3] Czech Metrol Inst, Jihlava, Czech Republic

来源：

2020 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS (CPEM) | 2020年

基金：

欧盟地平线“2020”;

关键词：

Material characterization; parameter extraction; VNA time-gating; RF metrology; measurement uncertainty;

D O I：

10.1109/cpem49742.2020.9191818

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A method is presented to measure materials and extract the complex permittivity without using classic VNA calibrations and time-gating. It is based on frequency selective normalization, analyzing error-terms and multiple-reflection phenomena. Measurement results (in free-space) are presented in 75-110 GHz and 500-750 GHz bands. The new normalization technique reduces uncertainties and simplifies the process.

引用

页数：2