A Multi-Granularity Power Modeling Methodology for Embedded Processors

被引:21
作者
Park, Young-Hwan [1 ]
Pasricha, Sudeep [2 ,3 ]
Kurdahi, Fadi J. [4 ]
Dutt, Nikil [4 ]
机构
[1] Samsung Adv Inst Technol, Yongin 446712, Gyeonggi Do, South Korea
[2] Colorado State Univ, Dept Elect & Comp Engn, Ft Collins, CO 80523 USA
[3] Colorado State Univ, Dept Comp Sci, Ft Collins, CO 80523 USA
[4] Univ Calif Irvine, Dept Elect Engn & Comp Sci, Irvine, CA 92617 USA
关键词
Digital systems; embedded processor performance; embedded processor power estimation; multi-granularity levels;
D O I
10.1109/TVLSI.2009.2039153
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
With power becoming a major constraint for multiprocessor embedded systems, it is becoming important for designers to characterize and model processor power dissipation. It is critical for these processor power models to be useable across various modeling abstractions in an electronic system level (ESL) design flow, to guide early design decisions. In this paper, we propose a unified processor power modeling methodology for the creation of power models at multiple granularity levels that can be quickly mapped to an ESL design flow. Our experimental results based on applying the proposed methodology on the OpenRISC and MIPS processors demonstrate the usefulness of having multiple power models. The generated models range from very high-level two-state and architectural/instruction set simulator models that can be used in transaction level models, to extremely detailed cycle-accurate models that enable early exploration of power optimization techniques. These models offer a designer tremendous flexibility to trade off estimation accuracy with estimation/simulation effort.
引用
收藏
页码:668 / 681
页数:14
相关论文
共 31 条
[1]   A power and performance model for network-on-chip architectures [J].
Banerjee, N ;
Vellanki, P ;
Chatha, KS .
DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS, 2004, :1250-1255
[2]   Networks on chips: A new SoC paradigm [J].
Benini, L ;
De Micheli, G .
COMPUTER, 2002, 35 (01) :70-+
[3]  
Bhattacharjee A., 2008, 2008 ACM/IEEE International Symposium on Low Power Electronics and Design - ISLPED, P335, DOI 10.1145/1393921.1394010
[4]   Reducing the complexity of instruction-level power models for VLIW processors [J].
Bona, A. ;
Sami, M. ;
Sciuto, D. ;
Silvano, C. ;
Zaccaria, V. ;
Zafalon, R. .
DESIGN AUTOMATION FOR EMBEDDED SYSTEMS, 2005, 10 (01) :49-67
[5]   Test power: a big issue in large SOC designs [J].
Bonhomme, Y ;
Girard, P ;
Landrault, C ;
Pravossoudovitch, S .
FIRST IEEE INTERNATION WORKSHOP ON ELECTRONIC DESIGN, TEST AND APPLICATIONS, PROCEEDINGS, 2002, :447-449
[6]  
Brooks D, 2000, PROCEEDING OF THE 27TH INTERNATIONAL SYMPOSIUM ON COMPUTER ARCHITECTURE, P83, DOI 10.1109/ISCA.2000.854380
[7]  
Burger D., 1997, Computer Architecture News, V25, P13, DOI 10.1145/268806.268810
[8]  
*CAD, 2008, CAD NC VER
[9]  
CHAKRABARTI C, 1999, P IEEE INT S CIRC SY, V1, P76
[10]  
Faraway JJ., 2004, LINEAR MODELS R, p68,101