Development of an ultra-high precision x-ray optics

被引:7
|
作者
Kitamoto, S [1 ]
Takano, H [1 ]
Saitoh, H [1 ]
Yamamoto, N [1 ]
Kohmura, T [1 ]
Suga, K [1 ]
Sekiguchi, H [1 ]
Ohkawa, Y [1 ]
Kanai, J [1 ]
Chiba, S [1 ]
机构
[1] Rikkyo Univ, Dept Phys, Toshima Ku, Tokyo 1718501, Japan
来源
ASTRONOMICAL ADAPTIVE OPTICS SYSTEMS AND APPLICATIONS | 2003年 / 5169卷
关键词
EUV; telescope; adaptive optics; Zr filter; multilayers;
D O I
10.1117/12.505571
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We are developing an ultra high precision Soft X-ray telescope. The design of the telescope is a normal incident one for 13.5nm band using Mo/Si multilayers. Two ideas are introduced. One is the optical measurement system in order to monitor the precision of the optics system. The other is the adaptive optics system with a deformable mirror. Using an X ray-optical separation filter, we can always monitor the deformation of the optics by optical light. With this information, we can control the deformable mirror to compensate the system distortion as a closed loop system. We confirmed that the absolute precision of the wave front sensor was less than 3 nm rms. This is also confirmed that the determination of the image center of each micro lens can be similar to1/100 of the pixel size. The precision of the deformable mirror was roughly 5 nm rms. Using the closed loop control the accuracy of the repeatability of the shape of the deformable mirror is less than 2 nm rms. The shape of the primary mirror was an off-axis paraboloide with an effective diameter of 80 mm. This primary mirror was coated by Mo/Si multilayers. The reflectivity of the primary mirror at 13.5nm was ranging from 30 to 50%. The X ray-optical separation filter was made from Zr with a thickness of similar to170 nm. The transmission of the filter for low energy X-ray was measured and was roughly 50% at 13.5nm.
引用
收藏
页码:268 / 275
页数:8
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