Pulsed X-ray diffraction structure study of shocked materials

被引:5
作者
Podurets, A. M. [1 ]
机构
[1] All Russian Res Inst Expt Phys, Fed State Unitary Enterprise Russian Fed Nucl Ctr, Sarov, Nizhny Novgorod, Russia
关键词
PHASE-TRANSITION; SINGLE-CRYSTALS; COMPRESSION; SILICON;
D O I
10.3367/UFNe.0181.201104l.0427
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:408 / 415
页数:11
相关论文
共 46 条
  • [31] PODURETS AM, 1997, INT C COND MATT UND, P285
  • [32] PODURETS AM, 1998, 8 INT C HIGH PRESS S
  • [33] PODURETS AM, 1988, 4 VSES K DET TEL, V1, P162
  • [34] Multiple x-ray diffraction to determine transverse and longitudinal lattice deformation in shocked lithium fluoride
    Rigg, PA
    Gupta, YM
    [J]. PHYSICAL REVIEW B, 2001, 63 (09):
  • [35] Schaufelberger Ph., 1972, High Temperatures - High Pressures, V4
  • [36] Tonkov E., 1983, FAZOVYE DIAGRAMMY SO
  • [37] Trunin R. F., 2006, Eksperimentalnye dannye po udarnovolnovomu szhatiyu i adiabaticheskomu rasshireniyu kondensirovannykh veshchestv
  • [38] TRUNIN RF, 1995, TEPLOFIZ VYS TEMP, V33, P222
  • [39] UMANSKII YS, 1969, RENTGENOGRAFIYA META, P209
  • [40] SHOCK LAUNCHING IN SILICON STUDIED WITH USE OF PULSED X-RAY-DIFFRACTION
    WARK, JS
    WHITLOCK, RR
    HAUER, A
    SWAIN, JE
    SOLONE, PJ
    [J]. PHYSICAL REVIEW B, 1987, 35 (17): : 9391 - 9394