Investigation of Heat Transfer of Bulk and Thin-Film PbInTe Samples by the Method of Dynamic Gratings

被引：3

作者：

Ivakin, E., V ^{[1
]}

Tolstik, A. L. ^{[1
]}

Gorbach, D., V ^{[1
]}

Stankevich, A. A. ^{[1
]}

机构：

[1] Belarusian State Univ, 4 Nezavisimost Ave, Minsk 220030, BELARUS

来源：

JOURNAL OF ENGINEERING PHYSICS AND THERMOPHYSICS | 2022年 / 95卷 / 04期

关键词：

thermoelectric material; lead telluride; heat transfer; thermal conductivity; thermal diffusivity; phase selection; thermal response;

D O I：

10.1007/s10891-022-02568-x

中图分类号：

O414.1 [热力学];

学科分类号：

摘要：

Measurements of the thermal diffusivity of thin and bulk indium-doped lead telluride have been taken using a modified method of dynamic gratings. Thermal gratings were recorded by a 20 ns pulsed laser radiation at a wave length of 532 nm. Dynamic gratings were recorded by a 635 nm continuous laser radiation. The analysis of the diffraction signal kinetics made it possible to determine the life-time of thermal gratings recorded in the investigated samples. It is shown that the use of an additional homodyne field coherent with respect to the diffraction signal field makes it possible to enhance and filter off the selected information component. Based on registered kinetic dependences of the diffracted signal intensity, the thermal diffusivity of bulk and thin film indium-doped lead telluride samples was determined. It has been established that for a micron-thick film, the thermal diffusivity is ten percent lower than for a bulk sample. An investigation has been made into the dependence of the heat transfer in the said samples on their temperature and it has been shown that the rise in the samples ' temperature in the range from 40 to 95 degrees C results in a 20-percent decrease of their thermal diffusivity.

引用

页码：1026 / 1030

页数：5

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