Complex Permittivity Measurement of Liquids Using Half Mode Corrugated Substrate Integrated Waveguide Structure

被引：0

作者：

Chedurupalli, Shivakumar ^{[1
]}

Vishwam, T. ^{[2
]}

James, Raju K. C. ^{[1
]}

机构：

[1] Univ Hyderabad, Sch Phys, Ctr Adv Studies Elect Sci & Technol, Hyderabad 500046, India

[2] GITAM Deemed Univ, Dept Phys, Rudraram 502329, Patancheru M, India

来源：

98TH ARFTG MICROWAVE MEASUREMENT CONFERENCE: NON-LINEAR METHODS AND MEASUREMENTS FOR RF AND MM-WAVE (ARFTG 2022) | 2022年

关键词：

Permittivity; Half Mode Corrugated Substrate Integrated Waveguide; dielectric property measurement; LINE;

D O I：

10.1109/ARFTG52954.2022.9844125

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Complex permittivity measurement of medium loss liquids with low sample volume determined in the discrete microwave (6.50 < v/GHz < 10) frequency region using partially filled half mode corrugated substrate integrated waveguide (PFIIMCSIW) structures. The ANSYS high frequency structure simulator (HFSS) is used to simulate the test structure mechanism. The transmission as well as reflection parameters are considered to evaluate the complex permittivity of the samples. The obtained permittivity data values are compared with the Open-ended coaxial probe technique data. The merits and demerits of both measurement techniques are discussed.

引用

页数：4

共 14 条

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