A Multi-objective Optimization Framework to Design Soft-Error-Immune Circuit

被引：0
|
作者：
Li, Yan [1 ]
Han, Jun [1 ]
Han, Yuanyuan [1 ]
Zeng, Xiaoyoung [1 ]
Zeng, Xiaoyang [1 ]
机构：
[1] Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai, Peoples R China
来源：
2019 19TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS) | 2022年
基金：
中国国家自然科学基金;
关键词：
Triple Module Redundancy; soft error; multiobjective optimization; neural network algorithm; NSGA-II algorithm; radiation hardening by design;
D O I：
10.1109/RADECS47380.2019.9745725
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
It is widely accepted that Triple Module Redundancy (TMR) hardened method is one of the most effective approach to protect circuit from soft error. However, while the mitigation of Soft Error Rate (SER) entails the inevitable sacrifice of area and power, little attention has been drawn to an optimization method to explore a trade-off between area, power and SER. Thus, with the help of neural network algorithm and NSGA-II algorithm, this study investigates a multi-objective optimization model as a guidance on Soft-Error-Immune circuit design.
引用
收藏
页码：184 / 187
页数：4
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