Battery life estimation of mobile embedded systems

被引:92
作者
Panigrahi, D [1 ]
Chiasserini, C [1 ]
Dey, S [1 ]
Rao, R [1 ]
Raghunathan, A [1 ]
Lahiri, K [1 ]
机构
[1] Univ Calif San Diego, Dept Elect & Comp Engn, San Diego, CA 92103 USA
来源
VLSI DESIGN 2001: FOURTEENTH INTERNATIONAL CONFERENCE ON VLSI DESIGN | 2001年
关键词
D O I
10.1109/ICVD.2001.902640
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Since battery life directly impacts the extent and duration of mobility, one of the key considerations in the design of a mobile embedded system should be to maximize the energy delivered by the battery, and hence the battery lifetime. To facilitate exploration of alternative implementations or a mobile embedded system, in this paper we address the issue of developing a fast and accurate battery model, and providing a framework for battery life estimation of Hardware/Software (HW/SW) embedded systems. We introduce a stochastic model of a battery, which can simultaneously model two key phenomena affecting the battery life and the amount of energy that can be delivered by the battery: the Rare Capacity effect and the Recovery effect. We model the battery behavior mathematically in terms of parameters that can be related to physical characteristics of the electro-chemical cell. We show how this model can be used for battery life estimation of a HW/SW embedded system, by calculating battery discharge demand waveforms using a power co-estimation technique. Based on the discharge demand, the battery model estimates the battery lifetime as well as the delivered energy. Application of the battery life estimation methodology to three system implementations of an example TCP/IP network interface subsystem demonstrate that different system architectures can have significantly different delivered energy and battery lifetimes.
引用
收藏
页码:57 / 63
页数:7
相关论文
共 17 条
[1]   Synthesis of application-specific memories for power optimization in embedded systems [J].
Benini, L ;
Macii, A ;
Macii, E ;
Poncino, M .
37TH DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 2000, 2000, :300-303
[2]  
Chandrakasan A.P., 1995, Low Power Digital CMOS Design
[3]  
CHIASSERINI CF, 2000, P INF 2000 TEL AV IS
[4]  
CHIASSERINI CF, 1999, P MILC 99 ATL CIT NJ
[5]   Analysis of capacity-rate data for lithium batteries using simplified models of the discharge process [J].
Doyle, M ;
Newman, J .
JOURNAL OF APPLIED ELECTROCHEMISTRY, 1997, 27 (07) :846-856
[6]   MODELING OF GALVANOSTATIC CHARGE AND DISCHARGE OF THE LITHIUM POLYMER INSERTION CELL [J].
DOYLE, M ;
FULLER, TF ;
NEWMAN, J .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1993, 140 (06) :1526-1533
[7]   RELAXATION PHENOMENA IN LITHIUM-ION-INSERTION CELLS [J].
FULLER, TF ;
DOYLE, M ;
NEWMAN, J .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1994, 141 (04) :982-990
[8]  
HAGEMAN SC, 1993, EDN, V38, P117
[9]  
LaFollette R. M., 1995, Proceedings of the Tenth Annual Battery Conference on Applications and Advances (Cat. No.95TH8035), P43, DOI 10.1109/BCAA.1995.398511
[10]   System-level test bench generation in a co-design framework [J].
Lajolo, M ;
Rebaudengo, M ;
Reorda, MS ;
Violante, M ;
Lavagno, L .
IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS, 2000, :25-30