Near-field probing of Bloch surface waves in a dielectric multilayer using photonic force microscopy

被引：11

作者：

Shilkin, Daniil A. ^{[1
]}

Lyubin, Evgeny V. ^{[1
]}

Soboleva, Irina V. ^{[1
,2
]}

Fedyanin, Andrey A. ^{[1
]}

机构：

[1] Moscow MV Lomonosov State Univ, Fac Phys, Moscow 119991, Russia

[2] Russian Acad Sci, Frumkin Inst Phys Chem & Electrochem, Moscow 119071, Russia

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS | 2016年 / 33卷 / 06期

基金：

俄罗斯科学基金会; 俄罗斯基础研究基金会;

关键词：

OPTICAL TWEEZERS; GRADIENT FORCE; TRAP; CALIBRATION; CRYSTAL;

D O I：

10.1364/JOSAB.33.001120

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The potential of photonic force microscopy (PFM) for probing the optical near-field in the vicinity of a dielectric multilayer is demonstrated. An experimental study of Bloch surface waves (BSWs) using PFM is described in detail. The applied technique is based on measuring the BSW-induced gradient force acting on a probe particle combined with precise control of the distance between the particle and the multilayer surface. The BSW-induced potential profile measured using PFM is presented. The force interaction between the probe and the BSW evanescent field is numerically studied. The results indicate that a polystyrene particle with a diameter of 1 mu m does not significantly perturb the BSW field and can be used to probe the optical near-field intensity in an elegant, noninvasive manner. (C) 2016 Optical Society of America

引用

页码：1120 / 1127

页数：8

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