Scanning Hall-probe microscopy system for two-dimensional imaging of critical current density in RE-123 coated conductors

被引:31
作者
Higashikawa, K. [1 ]
Inoue, M.
Kawaguchi, T.
Shiohara, K.
Imamura, K.
Kiss, T.
Iijima, Y. [2 ]
Kakimoto, K. [2 ]
Saitoh, T. [2 ]
Izumi, T. [3 ]
机构
[1] Kyushu Univ, Kiss Lab, Dept Elect Engn, Grad Sch Informat Sci & Elect Engn,Nishi Ku, Fukuoka 8190395, Japan
[2] Mat Technol Lab, Koto Ku, Tokyo 1358512, Japan
[3] Int Superconduct Technol Ctr, Superconduct Res Lab, Koto Ku, Tokyo 1350062, Japan
来源
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 2011年 / 471卷 / 21-22期
关键词
Coated conductor; Critical current distribution; External magnetic field; Scanning Hall-probe microscopy;
D O I
10.1016/j.physc.2011.05.118
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have developed a characterization method for two-dimensional imaging of critical current density in coated conductors (CCs) based on scanning Hall-probe microscopy (SHPM). The distributions of the magnetic field around a sample were measured for several different conditions of external magnetic fields, and then were converted to those of the sheet current density which flowed to shield the external magnetic field or to trap the penetrated magnetic field. As a result, it was found that the amplitude of the sheet current density corresponded to that of critical current density almost in all the area of the sample except for the region where current direction changed. This indicates that we could obtain an in-plane distribution of the critical current density with a spatial resolution of around 100 mu m in non-destructive manner by this method. We believe that this measurement will be a multifunctional and comprehensive characterization method for coated conductors. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:1036 / 1040
页数:5
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