Improved breakdown voltage in vertical GaN Schottky barrier diodes on free-standing GaN with Mg-compensated drift layer

被引:6
作者
Abhinay, S. [1 ]
Arulkumaran, S. [2 ,3 ]
Ng, G. I. [1 ,2 ]
Ranjan, K. [1 ,2 ]
Deki, M. [3 ]
Nitta, S. [3 ]
Honda, Y. [3 ]
Amano, H. [3 ]
机构
[1] Nanyang Technol Univ, Sch Elect & Elect Engn, 50 Nanyang Ave, Singapore 639798, Singapore
[2] Nanyang Technol Univ, Temasek Labs NTU, Res Techno Plaza,50 Nanyang Dr, Singapore 637553, Singapore
[3] Nagoya Univ, Inst Mat & Syst Sustainabil IMaSS, CIRFE, Nagoya, Aichi 4648603, Japan
关键词
Organic chemicals - III-V semiconductors - Magnesium compounds - Organometallics - Electric breakdown - Gallium nitride - Metallorganic chemical vapor deposition - Activation energy;
D O I
10.7567/1347-4065/ab65cd
中图分类号
O59 [应用物理学];
学科分类号
摘要
Vertical Schottky barrier diodes (SBD) were fabricated on 1a 5 mu m thick GaN drift layer (DL) with and without Mg-compensation grown by metal organic chemical vapour deposition on free-standing hydride vapour phase epitaxy grown substrate. The SBDs with Mg-compensated DL exhibited similar to 3.4 x higher breakdown voltage (V-bd) than the SBDs with conventional DL. The activation energy of 0.43 eV from the SBD with Mg-compensated DL can be correlated to the presence of Mg. The reverse current conduction mechanism of SBDs with Mg-compensated DL and conventional DL was dominated by thermionic field emission (TFE) and barrier modified TFE, respectively.
引用
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页数:5
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