Collected charge of planar silicon detectors after pion and proton irradiations Up to 2.2 x 1016 neq cm-2

被引:32
作者
Affolder, Anthony [1 ]
Allport, Phil [1 ]
Casse, Gianluigi [1 ]
机构
[1] Univ Liverpool, Dept Phys, Oliver Lodge Lab, Liverpool L69 3BX, Merseyside, England
关键词
Silicon micro-strip detectors; Radiation damage; Super LHC; Charge collection efficiency;
D O I
10.1016/j.nima.2010.02.187
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The planned luminosity upgrade of the Large Hadron Collider at CERN (Super-LHC) will provide a challenging environment for the tracking and vertexing detector systems. Planar, segmented silicon detectors are one of the few radiation tolerant technologies under consideration for use for the Super-LHC tracking detectors in either pixel or strip geometries. In this paper, charge collection measurements are made with planar silicon sensors with 2 different substrate materials (float zone and magnetic Czochralski) and 3 different diode configurations (p+ strip in n-bulk, n+ strip in n-bulk, and n+ strip in p-bulk). For the first time, a comparison of the charge collection of these devices will be made after irradiation up to 6 x 10(14) n(eq) cm(-2) with 280 MeV charged pions, and up to 2.2 x 10(16) n(eq) cm(-2) with 26 MeV protons. This study covers the expected range of final fluences for the different layers of pixel and microstrip sensors of the ATLAS and CMS experiments at the Super-LHC. These measurements have been carried out using analogue, high-speed (40 MHz) electronics and a Strontium-90 beta source. Crown Copyright (C) 2010 Published by Elsevier B.V. All rights reserved.
引用
收藏
页码:177 / 179
页数:3
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