Fabrication and characterization of field emission points for ion production in Penning trap applications

被引：6

作者：

Redshaw, Matthew ^{[1
,2
]}

Benjamin, Anne L. ^{[3
]}

Bollen, Georg ^{[1
,4
]}

Ferrer, Rafael ^{[1
]}

Lincoln, David L. ^{[1
,4
]}

Ringle, Ryan ^{[1
]}

Schwarz, Stefan ^{[1
]}

Valverde, Adrian A. ^{[1
,4
]}

机构：

[1] Michigan State Univ, Natl Superconducting Cyclotron Lab, E Lansing, MI 48824 USA

[2] Cent Michigan Univ, Dept Phys, Mt Pleasant, MI 48859 USA

[3] Wellesley Coll, Dept Phys, Wellesley, MA 02481 USA

[4] Michigan State Univ, Dept Phys, E Lansing, MI 48824 USA

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY | 2015年 / 379卷

基金：

美国国家科学基金会;

关键词：

TUNGSTEN; TIPS; ELECTRON;

D O I：

10.1016/j.ijms.2015.01.006

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

A series of cold cathode field emission points to be used for electron impact ionization of background gas in Penning trap mass spectrometry applications have been fabricated by electrochemically etching tungsten rod in a NaOH solution. A new variation of the drop-off etching method that can produce tips with tip radii down to 10 nm is described. We present the results of studies in which the parameters used in the etching process were varied, and the geometry and operation of the resulting tips was investigated by imaging them with a scanning electron microscope and by operating them in field emission mode. Finally, the use of these tips in a Penning trap mass spectrometry application is described. (C) 2015 Elsevier B.V. All rights reserved.

引用

页码：187 / 193

页数：7

共 25 条

[1] ATOMIC FORCE MICROSCOPE [J].