Elements Provide a Clue: Nanoscale Characterization of Thin-Film Composite Polyamide Membranes

被引：53

作者：

Lu, Xinglin ^{[1
]}

Nejati, Siamak ^{[2
]}

Choo, Youngwoo ^{[2
]}

Osuji, Chinedum O. ^{[2
]}

Ma, Jun ^{[1
]}

Elimelech, Menachem ^{[2
]}

机构：

[1] Harbin Inst Technol, State Key Lab Urban Water Resource & Environm, Harbin 150090, Peoples R China

[2] Yale Univ, Dept Chem & Environm Engn, New Haven, CT 06520 USA

来源：

ACS APPLIED MATERIALS & INTERFACES | 2015年 / 7卷 / 31期

关键词：

thin-film composite membrane; polyamide-polysulfone interface; elemental contrast; nanoscale characterization; REVERSE-OSMOSIS MEMBRANE; ATOMIC-FORCE MICROSCOPY; NANOFILTRATION MEMBRANES; POLYSULFONE MEMBRANES; WATER DESALINATION; RO MEMBRANES; INTERFACIAL POLYMERIZATION; PERFORMANCE CORRELATION; SEAWATER DESALINATION; FUNCTIONAL-GROUPS;

D O I：

10.1021/acsami.5b05478

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

In this study, we exploit the nitrogen sulfur elemental contrast of thin-film composite (TFC) polyamide membranes and present, for the first time, the application of two elemental analysis techniques, scanning transmission electron microscopy-energy-dispersive X-ray spectroscopy (STEM-EDX) and X-ray photoelectron spectroscopy (XPS) C-60(+) ion-beam sputtering, to elucidate the nanoscale structure and chemical composition of the polyamide polysulfone interface. Although STEM-EDX elemental mapping depicts the presence of a dense polyamide layer at the interface, it is incapable of resolving the elemental contrast at nanoscale resolution at the interfacial zone. Depth-resolved XPS C-60(+) ion-beam sputtering enabled nanoscale characterization of the polyamide polysulfone interface and revealed the presence of a heterogeneous layer that contains both polyamide and polysulfone signatures. Our results have important implications for future studies to elucidate the structure property performance relationship of TFC membranes.

引用

页码：16917 / 16922

页数：6

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