Concentrated-mass cantilever enhances multiple harmonics in tapping-mode atomic force microscopy

被引：35

作者：

Li, Huiling ^{[1
]}

Chen, Yan ^{[1
]}

Dai, Lanhong ^{[1
]}

机构：

[1] Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech LNM, Beijing 100190, Peoples R China

来源：

APPLIED PHYSICS LETTERS | 2008年 / 92卷 / 15期

基金：

中国国家自然科学基金;

关键词：

D O I：

10.1063/1.2909535

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The natural frequencies of a cantilever probe can be tuned with an attached concentrated mass to coincide with the higher harmonics generated in a tapping-mode atomic force microscopy by the nonlinear tip-sample interaction force. We provide a comprehensive map to guide the choice of the mass and the position of the attached particle in order to significantly enhance the higher harmonic signals containing information on the material properties. The first three eigenmodes can be simultaneously excited with only one carefully positioned particle of specific mass to enhance multiple harmonics. Accessing the interaction force qualitatively based on the high-sensitive harmonic signals combines the real-time material characterization with the imaging capability. (C) 2008 American Institute of Physics.

引用

页数：3

共 19 条

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