X-ray diffraction study of cerium- and thulium-doped (Sr,Ba)Nb2O6 single crystals

被引:9
作者
Chernaya, TS
Volk, TR
Maksimov, BA
Blomberg, MK
Ivleva, LI
Verin, IA
Simonov, VI
机构
[1] Russian Acad Sci, Shubnikov Inst Crystallog, Moscow 119991, Russia
[2] Univ Helsinki, Dept Phys, FIN-00014 Helsinki, Finland
[3] Russian Acad Sci, Inst Gen Phys, Moscow 117942, Russia
基金
俄罗斯基础研究基金会;
关键词
Solid Solution; Structural Characteristic; Rare Earth; Diffraction Data; Earth Element;
D O I
10.1134/1.1627434
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The structural models of cerium- and thulium-doped (Sr0.61Ba0.39)Nb2O6 solid solutions were established and refined on the basis of single-crystal X-ray diffraction data. The dopants were located, and their concentrations in the specimens were refined. The effect of the Sr/Ba ratio and doping with rare earth elements on the structural characteristics of (SrxBa1-x)Nb2O6 crystals was analyzed. (C) 2003 MAIK "Nauka/Interperiodica".
引用
收藏
页码:933 / 938
页数:6
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