Minimal resonator loss for circuit quantum electrodynamics

被引：87

作者：

Barends, R. ^{[1
]}

Vercruyssen, N. ^{[1
]}

Endo, A. ^{[1
]}

de Visser, P. J. ^{[1
,2
]}

Zijlstra, T. ^{[1
]}

Klapwijk, T. M. ^{[1
]}

Diener, P. ^{[2
]}

Yates, S. J. C. ^{[2
]}

Baselmans, J. J. A. ^{[2
]}

机构：

[1] Delft Univ Technol, Dept Appl Phys, Kavli Inst NanoSci, NL-2628 CJ Delft, Netherlands

[2] SRON Netherlands Inst Space Res, NL-3584 CA Utrecht, Netherlands

来源：

APPLIED PHYSICS LETTERS | 2010年 / 97卷 / 02期

关键词：

current density; nanostructured materials; silicon compounds; solar cells; wide band gap semiconductors; CAVITY; QUBITS;

D O I：

10.1063/1.3458705

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report quality factors of up to 500 x 10(3) in superconducting resonators at the single photon levels needed for circuit quantum electrodynamics. This result is achieved by using NbTiN and removing the dielectric from regions with high electric fields. As demonstrated by a comparison with Ta, the crucial sources of intensity-dependent loss are dielectrics on the surface of the metal and substrate. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3458705]

引用

页数：3

共 21 条

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