Accurate background correction in neutron reflectometry studies of soft condensed matter films in contact with fluid reservoirs

被引:0
作者
Hoogerheide, David P. [1 ]
Heinrich, Frank [1 ,2 ]
Maranville, Brian B. [1 ]
Majkrzak, Charles F. [1 ]
机构
[1] NIST, Ctr Neutron Res, Gaithersburg, MD 20899 USA
[2] Carnegie Mellon Univ, Dept Phys, Pittsburgh, PA 15213 USA
基金
美国国家科学基金会;
关键词
neutron reflectometry; background subtraction; incoherent scattering; data reduction; soft condensed matter; thin films; REFLECTION; PROTEINS; MODELS;
D O I
10.1107/S160057671901481X
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Neutron reflectometry (NR) is a powerful method for looking at the structures of multilayered thin films, including biomolecules on surfaces, particularly proteins at lipid interfaces. The spatial resolution of the film structure obtained through an NR experiment is limited by the maximum wavevector transfer at which the reflectivity can be measured. This maximum is in turn determined primarily by the scattering background, e.g. from incoherent scattering from a liquid reservoir or inelastic scattering from cell materials. Thus, reduction of scattering background is an important part of improving the spatial resolution attainable in NR measurements. Here, the background field generated by scattering from a thin liquid reservoir on a monochromatic reflectometer is measured and calculated. It is shown that background subtraction utilizing the entire background field improves data modeling and reduces experimental uncertainties associated with localized background subtraction.
引用
收藏
页码:15 / 26
页数:12
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