Measurement of the modulation transfer function of a slow-scan CCD camera on a TEM using a thin amorphous film as test signal

A technique is proposed to measure the modulation transfer function of a slow-scan CCD camera mounted on a transmission electron microscope. The measurement is done from only three images: two images taken at different magnifications of a thin amorphous specimen and one image taken without a specimen in the electron beam. The advantage of this technique is that neither the CCD camera has to be dismounted nor special equipment has to be used. The first experiments show that this technique gives reproducible results, but more experiments are necessary to compare the results with other methods.