Two wavelength simultaneous DSPI and DSP for 3D displacement field measurements

被引：11

作者：

Bhaduri, Basanta ^{[1
]}

Tay, C. J. ^{[1
]}

Quan, C. ^{[1
]}

Niu, H. ^{[1
]}

Sjodahl, Mikael ^{[2
]}

机构：

[1] Natl Univ Singapore, Dept Mech Engn, Singapore 117576, Singapore

[2] Lulea Univ Technol, Div Expt Mech, SE-97187 Lulea, Sweden

来源：

OPTICS COMMUNICATIONS | 2011年 / 284卷 / 10-11期

关键词：

Digital speckle pattern interferometry (DSPI); Digital speckle photography (DSP); Fourier transform method (FTM); Displacement measurement; SPECKLE-PATTERN INTERFEROMETRY; PHOTOGRAPHY;

D O I：

10.1016/j.optcom.2011.01.036

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A novel optical system is proposed that implements digital speckle pattern interferometry (DSPI) and digital speckle photography (DSP) simultaneously using two wavelength illumination of an object for simultaneous measurement of all three components of the displacement vector field. A collimated red light illuminates both the object and a reference surface in a DSPI configuration which is sensitive to out-of-plane displacement field while a blue light illuminates the object in a DSP configuration which is sensitive to in-plane displacement fields. A color 3-CCD camera records the red and blue lights individually through its red and blue channels, respectively. Two reference images and one image in the deformed state of the object are required for quantitative measurement. Experimental results are presented to validate the system. (C) 2011 Elsevier B.V. All rights reserved.

引用

页码：2437 / 2440

页数：4