Spectroscopic ellipsometry studies of Ba0.9Sr0.1TiO3 thin films

被引：0

作者：

Yang, SH ^{[1
]}

Li, HQ

Zhang, YL

Mo, D

Tian, HY

Luo, WG

Pu, XH

Ding, AL

机构：

[1] Zhongshan Univ, Dept Phys, Guangzhou 510275, Peoples R China

[2] Chinese Acad Sci, Lab Funct Inorgan Mat, Shanghai 200050, Peoples R China

来源：

JOURNAL OF INORGANIC MATERIALS | 2001年 / 16卷 / 02期

关键词：

spectroscopic ellipsometry; optical constant spectra; BST films;

D O I：

暂无

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Ellipsometric spectra of Ba0.9Sr0.1TiO3 (BST) thin films with various annealing temperatures were measured in the range of photon energy from 2.1 to 5.2eV. Constructing appropriate fitting models and describing optical properties of the BST with Cauchy dispersion model, their optical constants (refractive index n and extinction coefficient k) spectra and band gap E-g were determined by means of an optimization. Compared these results, we obtained the variation of the refractive index n, the extinction coefficient k and the band gap E-g with annealing temperatures.

引用

页码：305 / 310

页数：6

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