Dynamic phenomena at mode-I crack front in silicon simulated by extended molecular dynamics

被引:12
作者
Inamura, T. [1 ]
Takezawa, N. [1 ]
Shibuya, K. [1 ]
Yamada, K. [1 ]
机构
[1] Nagoya Inst Technol, Showa Ku, Nagoya, Aichi 4668555, Japan
关键词
simulation; brittle fracture; microdynamics;
D O I
10.1016/j.cirp.2007.05.134
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Analytical-solution-controlled molecular dynamics that can simulate atomic-scale phenomena around a crack front has been extended so that it can also simulate phenomena caused dynamically by elastic/plastic waves. The result of the simulation for monocrystalline silicon shows that a quasi-statically opening crack creates voids around the crack front and leaves dimples on the fractured surfaces as in cases of ductile fracture. On the other hand, elastic/plastic waves emitted from around the crack front change the above phenomena such that various surfaces., from smooth to very rough ones, result. A smooth surface is created by a Rayleigh wave that travels along fractured surfaces, creating new surfaces at its wavefront, while a rough surface is made by a chain mechanism wherein a void is created by wave-driven cross slip and this void, in turn, emits new waves which cause voids.
引用
收藏
页码:561 / 564
页数:4
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