Optical characterization of MEH-PPV/Alq3 composite films

被引：4

作者：

Kumar, A

Bhatnagar, PK

Mathur, PC

Tada, K

Onoda, M

机构：

[1] Univ Delhi, Dept Elect Sci, New Delhi 110021, India

[2] Himeji Inst Technol, Dept Elect Engn, Himeji, Hyogo 67122, Japan

来源：

JOURNAL OF MATERIALS SCIENCE | 2005年 / 40卷 / 14期

关键词：

D O I：

10.1007/s10853-005-2556-9

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The optical characterization of MEH-PPV/Alq3 composite was made by investigating its absorption and photoluminescence spectra. The MEH-PPV films were grown over glass substrate using spin cast technique. MEH-PPV powder was dissolved in p-xylene at a concentration 10 mg/ml to obtain thicker films of thickness∼400nm. As the MEH-PPV was a poor electron transporting material, Alq3 which was good electron transporting material was deposited using vacuum evaporation technique on MEH-PPV films. It was found that the absorption peak in the composite was much stronger as compared to that of MEH-PPV film.

引用

收藏

页码：3849 / 3851

页数：3

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