Overabundant single-particle electron microscope views induce a three-dimensional reconstruction artifact

被引：31
|
作者：
Boisset, N
Penczek, PA
Taveau, JC
You, V
de Haas, F
Lamy, J
机构：
[1] CNRS, Grp Anal Struct Antigen, F-37032 Tours, France
[2] New York State Dept Hlth, Wadsworth Ctr Labs & Res, Albany, NY 12201 USA
来源：
ULTRAMICROSCOPY | 1998年 / 74卷 / 04期
关键词：
cryoelectron microscopy; three-dimensional reconstruction; single particle molecular architecture;
D O I：
10.1016/S0304-3991(98)00042-4
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
In the field of single-particles 3D reconstruction, the development of angular assignment techniques has allowed the collection of a large amount of cryoelectron microscope images of untilted-specimens. When particles have a preferential orientation within the ice layer, one type of electron microscope (EM) view is oversampled and produces a new type of 3D reconstruction artifact, This oversampling artifact is observed with simultaneous iterative reconstruction techniques (SIRT) but the theoretical analysis of the problem indicates that similar effects could also occur with other reconstruction algorithms. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：201 / 207
页数：7
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