Label-free detection of DNA hybridization at the nanoscale: A highly sensitive and selective approach using atomic-force microscopy

被引：59

作者：

Zhou, DJ ^{[1
]}

Sinniah, K ^{[1
]}

Abell, C ^{[1
]}

Rayment, T ^{[1
]}

机构：

[1] Univ Cambridge, Dept Chem, Cambridge CB2 1EW, England

来源：

ANGEWANDTE CHEMIE-INTERNATIONAL EDITION | 2003年 / 42卷 / 40期

关键词：

DNA structures; monolayers; nanolithography; scanning probe microscopy; self-assembly;

D O I：

10.1002/anie.200352178

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Less than 10-21 mol of label-free probe DNA with high sequence specificity can be quantitatively detected on a surface by using AFM to create nanofeatures of single-stranded DNA and monitor the topographic changes upon exposure to a complimentary DNA (see scheme).

引用

页码：4934 / 4937

页数：4

共 12 条

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