An experimental and theoretical investigation into methods concerned with "reflection loss" for microwave absorbing materials

被引:36
作者
Liu, Ying [1 ]
Drew, Michael G. B. [2 ]
Li, Hexing [3 ]
Liu, Yue [1 ]
机构
[1] Shenyang Normal Univ, Coll Chem & Chem Engn, Shenyang 110034, Peoples R China
[2] Univ Reading, Sch Chem, Reading RG6 6AD, Berks, England
[3] Shanghai Univ Elect Power, Shanghai 200234, Peoples R China
关键词
Material characterization; Material measurements; Measurement of dielectric and magnetic materials; Transmission-line theory; REDUCED GRAPHENE OXIDE; ABSORPTION PROPERTIES; FACILE SYNTHESIS; ELECTROMAGNETIC PROPERTIES; CARBONIZED DESIGN; LOOFAH-SPONGE; PERFORMANCE; COMPOSITES; LIGHTWEIGHT; SHELL;
D O I
10.1016/j.matchemphys.2020.122624
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
There have been many recent advances in telecommunications, which have led to increased attention in reducing microwave interference. However, some vital persistent problems in the field of microwave absorption have hindered such research despite the amount of work published. Indeed, an inaccurate method of characterization and interpretation of experimental results using reflection loss has become common-place and is regularly used. It is demonstrated here that this established theory of reflection loss contradicts fundamental principles in transmission-line theory and as a result is used to interpret experimental data wrongly. The input impedance in transmission-line theory has been distorted in microwave absorption reports and the concept of impedance matching from reflection loss is illogical. In the present work, using newly obtained experimental data, a simple procedure has been developed that successfully relates such data with the correct theory. This involves classifying the interactions between material and microwave into two distinct categories, namely isolated interface and material acting as a circuit element. The problems associated with the previous concepts defined by the term reflection loss, RL, have been clarified. The sophisticated relationship between reflection coefficient and input impedance has been discussed.
引用
收藏
页数:17
相关论文
共 111 条
[1]  
[Anonymous], NY TIMES
[2]  
Baker-Jawis J., 1993, NATL I STAND TECHNOL, P1355
[3]   IMPROVED TECHNIQUE FOR DETERMINING COMPLEX PERMITTIVITY WITH THE TRANSMISSION REFLECTION METHOD [J].
BAKERJARVIS, J ;
VANZURA, EJ ;
KISSICK, WA .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1990, 38 (08) :1096-1103
[4]   Ferroferric Oxide/Multiwalled Carbon Nanotube vs Polyaniline/Ferroferric Oxide/Multiwalled Carbon Nanotube Multiheterostructures for Highly Effective Microwave Absorption [J].
Cao, Mao-Sheng ;
Yang, Jian ;
Song, Wei-Li ;
Zhang, De-Qing ;
Wen, Bo ;
Jin, Hai-Bo ;
Hou, Zhi-Ling ;
Yuan, Jie .
ACS APPLIED MATERIALS & INTERFACES, 2012, 4 (12) :6949-6956
[5]   Graphene nanohybrids: excellent electromagnetic properties for the absorbing and shielding of electromagnetic waves [J].
Cao, Maosheng ;
Han, Chen ;
Wang, Xixi ;
Zhang, Min ;
Zhang, Yanlan ;
Shu, Jincheng ;
Yang, Huijing ;
Fang, Xiaoyong ;
Yuan, Jie .
JOURNAL OF MATERIALS CHEMISTRY C, 2018, 6 (17) :4586-4602
[6]   Simulation of multiple composite coatings based on conducting plate and investigation of microwave reflectivity [J].
Cao, MS ;
Zhu, J ;
Yuan, J ;
Peng, ZH ;
Xiao, G .
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2002, 34 (06) :442-445
[7]  
Chang K., 2005, ENCY RF MICROWAVE EN, V1, P1551
[8]   Microwave absorbing properties of two dimensional materials GeP5 enhanced after annealing treatment [J].
Chang, Yukai ;
Mu, Congpu ;
Yang, Bingchao ;
Nie, Anmin ;
Wang, Bochong ;
Xiang, Jianyong ;
Yang, Yong ;
Wen, Fusheng ;
Liu, Zhongyuan .
APPLIED PHYSICS LETTERS, 2019, 114 (01)
[9]   Porous Graphene Microflowers for High-Performance Microwave Absorption [J].
Chen, Chen ;
Xi, Jiabin ;
Zhou, Erzhen ;
Peng, Li ;
Chen, Zichen ;
Gao, Chao .
NANO-MICRO LETTERS, 2018, 10 (02)
[10]   Effect of Ti3SiC2 addition on microwave absorption property of plasma sprayed Ti3SiC2/NASICON coatings [J].
Chen, Dan ;
Luo, Fa ;
Zhou, Wancheng ;
Zhu, Dongmei .
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2018, 29 (16) :13534-13540