High-Resolution Structural Characterization of Two Layered Aluminophosphates by Synchrotron Powder Diffraction and NMR Crystallographies (vol 25, pg 2227, 2013)

被引:0
作者
Bouchevreau, Boris [1 ]
Martineau, Charlotte [1 ]
Mellot-Draznieks, Caroline [1 ]
Dutour, Julien [1 ]
Tuel, Alain [1 ]
Suchomel, Matthew R. [1 ]
Trebosc, Julien [1 ]
Lafon, Olivier [1 ]
Amoureux, Jean-Paul [1 ]
Taulelle, Francis [1 ]
机构
[1] Univ Versailles St Quentin Yvelines, Inst Lavoisier Versailles, CNRS, UMR 8180, 45 Ave Etats Unis, F-78035 Versailles, France
关键词
D O I
10.1021/acs.chemmater.6b02372
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:5172 / 5172
页数:1
相关论文
共 4 条
[1]   High-Resolution Structural Characterization of Two Layered Aluminophosphates by Synchrotron Powder Diffraction and NMR Crystallographies [J].
Bouchevreau, Boris ;
Martineau, Charlotte ;
Mellot-Draznieks, Caroline ;
Tuel, Alain ;
Suchomel, Matthew R. ;
Trebosc, Julien ;
Lafon, Olivier ;
Amoureux, Jean-Paul ;
Taulelle, Francis .
CHEMISTRY OF MATERIALS, 2013, 25 (11) :2227-2242
[2]  
Dutour J., 2006, THESIS
[3]  
Guillou N., 2005, STRUCTURAL DETERMINA
[4]  
Guillou N., 2006, 10 EUR POWD DIFFR C, P110