About the art to shoot with single ions

被引：42

作者：

Fischer, BE ^{[1
]}

Heiss, M ^{[1
]}

Cholewa, M ^{[1
]}

机构：

[1] GSI Darmstadt, D-64291 Darmstadt, Germany

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2003年 / 210卷

关键词：

ion microprobe; single hit facility; beam switch; hit detector;

D O I：

10.1016/S0168-583X(03)01038-3

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The article describes the history and motivation for the development and application of the single hit technique at GSI, and it describes some basic elements and their influence on its performance. (C) 2003 Elsevier B.V. All rights reserved.

引用

页码：285 / 291

页数：7

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