Ultrafast decay of surface photo-voltage effect on n-type GaAs(100) surface

被引:16
作者
Tokudomi, Shinji [1 ]
Azuma, Junpei [1 ]
Takahashi, Kazutoshi [1 ]
Kamada, Masao [1 ]
机构
[1] Saga Univ, Synchrotron Light Applicat Ctr, Saga 8408502, Japan
关键词
surface photo-voltage; SPV; time-resolved photoemission spectroscopy; TR-PES; GaAs(100); ultrafast; two-photon excitation;
D O I
10.1143/JPSJ.76.104710
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Surface photo-voltage (SPV) effect on n-type GaAs(100) has been investigated with a newly developed time-resolved photoemission spectroscopy, in which the sample surface is excited by onephoton of the pump pulse and the photoemission is measured by two-photon excitation of the probe pulse. Ultrafast decay of the SPV was found in a several picosecond range at 300 and 100K, corresponding to the hot-electron lifetime in GaAs. The slow SPV decay was also observed in a few hundred picoseconds, due to the thermalized electrons.
引用
收藏
页数:4
相关论文
共 19 条
[1]   Transient photoconductivity in GaAs as measured by time-resolved terahertz spectroscopy [J].
Beard, MC ;
Turner, GM ;
Schmuttenmaer, CA .
PHYSICAL REVIEW B, 2000, 62 (23) :15764-15777
[2]   Charge carrier dynamics at the SiO2/Si(100) surface:: a time-resolved photoemission study with combined laser and synchrotron radiation [J].
Bröcker, D ;
Giessel, T ;
Widdra, W .
CHEMICAL PHYSICS, 2004, 299 (2-3) :247-251
[3]   SUBPICOSECOND CARRIER TRANSPORT IN GAAS SURFACE-SPACE-CHARGE FIELDS [J].
DEKORSY, T ;
PFEIFER, T ;
KUTT, W ;
KURZ, H .
PHYSICAL REVIEW B, 1993, 47 (07) :3842-3849
[4]   Physics of high-intensity nanosecond electron source: Charge limit phenomenon in GaAs photocathodes [J].
HerreraGomez, A ;
Vergara, G ;
Spicer, WE .
JOURNAL OF APPLIED PHYSICS, 1996, 79 (09) :7318-7323
[5]   Resonant spin amplification in n-type GaAs [J].
Kikkawa, JM ;
Awschalom, DD .
PHYSICAL REVIEW LETTERS, 1998, 80 (19) :4313-4316
[6]   DIRECT MEASUREMENT OF HOT-ELECTRON RELAXATION BY PICOSECOND SPECTROSCOPY [J].
LINDE, DVD ;
LAMBRICH, R .
PHYSICAL REVIEW LETTERS, 1979, 42 (16) :1090-1093
[7]   SURFACE SPACE-CHARGE DYNAMICS AND SURFACE RECOMBINATION ON SILICON(111) SURFACES MEASURED WITH COMBINED LASER AND SYNCHROTRON RADIATION [J].
LONG, JP ;
SADEGHI, HR ;
RIFE, JC ;
KABLER, MN .
PHYSICAL REVIEW LETTERS, 1990, 64 (10) :1158-1161
[8]   PULSED LASER-INDUCED PHOTOCHEMICAL DECOMPOSITION OF GAAS(110) STUDIED WITH TIME-RESOLVED PHOTOELECTRON-SPECTROSCOPY USING SYNCHROTRON RADIATION [J].
LONG, JP ;
GOLDENBERG, SS ;
KABLER, MN .
PHYSICAL REVIEW LETTERS, 1992, 68 (07) :1014-1017
[9]   Transient charge carrier distribution at UV-photoexcited SiO2/Si interfaces [J].
Marsi, M ;
Belkhou, R ;
Grupp, C ;
Panaccione, G ;
Taleb-Ibrahimi, A ;
Nahon, L ;
Garzella, D ;
Nutarelli, D ;
Renault, E ;
Roux, R ;
Couprie, ME ;
Billardon, M .
PHYSICAL REVIEW B, 2000, 61 (08) :R5070-R5073
[10]   Femtosecond time-resolved photoemission study of hot electron relaxation at the GaAs(100) surface [J].
Schmuttenmaer, CA ;
Miller, CC ;
Herman, JW ;
Cao, J ;
Mantell, DA ;
Gao, Y ;
Miller, RJD .
CHEMICAL PHYSICS, 1996, 205 (1-2) :91-108